MEMS Testing and Reliability 20122012-10-18
Santa Clara, CA
4th Annual Conference on MEMS Testing and Reliability
MEMS Journal and MEPTEC are pleased to bring you MEMS Testing and Reliability 2012 - the premier networking and educational event for MEMS test professionals.
Call for Speakers
If you are interested in joining us as a speaker for this event, please email Dr. Mike Pinelis at firstname.lastname@example.org.
About the Conference
As MEMS production volumes continue to pick up, there is increased pressure on manufacturers and foundries to reduce costs. MEMS testing has traditionally accounted for 10-45% of the total device costs and can easily affect the profitability level for the device makers. Therefore, MEMS foundries and fabless MEMS companies need to ensure that they have in-house expertise and continual improvement in the area of MEMS testing.
While MEMS testing is similar to IC chip testing in the semiconductors industry, MEMS devices present further challenges because mechanical, chemical and optical parameters must be tested in addition to electrical properties. This event will focus on bringing together the leading MEMS testing experts and relevant equipment suppliers. Additionally, some presence will be given to IC chip test experts so that they could also share their best practices with the audience.
Topics will include:
By participating in this event, you will ensure that your organization stays current with the latest MEMS testing and reliability techniques; therefore, you will increase yields, decrease waste and increase profitability for your company.
For more information: http://memstest2012.com/