Optical Measurement Techniques for Characterization of MEMS Devices2013-01-23
Webinar. Time: 11 AM PST / 2PM EST
Presented by Eric Lawrence, MEMS Business Development, Polytec
Are you working to optimize the performance of your MEMS device? Learn how Polytec's latest technology is used to characterize MEMS devices for real-world applications. Our Micro System Analyzer (MSA-500) combines powerful tools for analysis and visualization of structural vibration of MEMS. This features Laser Doppler Vibrometry for measurement of out-of-plane motion with resolution down to picometers and bandwidth out to GHz.
For more information: https://polytec.webex.com/cmp0307l/webcomponents/widget/detect.do?siteurl=polytec&LID=1&RID=2&TID=4&rnd=3480640836&DT=-300&DL=en-US&isDetected=true&backUrl=%2Fec0606l%2Feventcenter%2Fenroll%2Fjoin.do%3Fsiteurl%3Dpolytec%26confId%3D1157743200