A MEMS Clearinghouse® and information portal
for the MEMS and Nanotechnology community
RegisterSign-In
MEMSnet Home About Us What is MEMS? Beginner's Guide Discussion Groups Advertise Here
News
MEMSnet Home: MEMS-Talk: RIE reflected power too high during Si etch
RIE reflected power too high during Si etch
2004-01-06
Michael L
2004-01-07
R. Brent Garber (2 parts)
2004-01-07
Neal Ricks
2004-01-07
Tony Li
2004-01-06
[email protected]
RIE reflected power too high during Si etch
Tony Li
2004-01-07
I guess the anisotropic program uses low pressure and high voltage. The
isotropic should use high pressure and lower voltage. However, high pressure
means pumping rate is higher now, you may have to increase flow rate,
otherwise there is not enough gas to maintain plasma. Anyway, try play those
parameters so you can get a stable plasma, shouldn't be difficult.
----- Original Message -----
From: "Michael L" 
To: 
Sent: Tuesday, January 06, 2004 7:59 AM
Subject: [mems-talk] RIE reflected power too high during Si etch


> Hello,
>
> I am trying to isotropically etch grooves (20 um wide; 10-20 um deep) in
Si
> using an RIE. I am getting high reflected powers whenever I deviate from
the
> standard (anisotropic) Si etch recipe. Sometimes, the value starts off low
> but then reaches 10% of the forward power, at which point the system cuts
> off automatically. Would anyone have any information (or know where I can
> get some information) on the main factors that affect the reflected power?
>
> Any information would be useful.
>
> Many thanks,
>
> Michael
>
> _________________________________________________________________
> Express yourself with cool new emoticons
http://www.msn.co.uk/specials/myemo
>
>
>
>



reply
Events
Glossary
Materials
Links
MEMS-talk
Terms of Use | Contact Us | Search
MEMS Exchange
MEMS Industry Group
Coventor
Harrick Plasma
Tanner EDA
The Branford Group
Harrick Plasma, Inc.
Tanner EDA by Mentor Graphics
MEMS Technology Review