Hi,

I'm currently trying to estimate my sensor resistance to applied load. I would
like to estimate if internal stresses are far under yield stresses.

I was using Von Mises stresses for comparaison. The sensor is made of silicon
which is fragile.

It seems that Von Mises criterium is not acurate for fragile material.

Does someone know if there is another criterion I can chose in Ansys?

Thank you,

Julie.