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MEMSnet Home: MEMS-Talk: Ti layer measurement...
Ti layer measurement...
2009-02-09
Javier Crespo
2009-02-09
Jie Zou
2009-02-09
Evelyn B
2009-02-13
Albert Henning
2009-02-13
Brian Stahl
2009-02-13
Rick Williston
2009-02-17
Albert Henning
2009-02-18
Fei Wang
2009-02-18
Wilson, Thomas
2009-02-18
Kirt Williams
2009-02-18
Mehmet Aykol
Ti layer measurement...
Wilson, Thomas
2009-02-18
One more potentially useful method ... one can also deposit the film (of same
thickness as desired) onto a glass slide, weigh it, etch the film off in acid,
and weigh the bare glass slide to determine the film's mass. One only needs in
addition the film density and area of the slide. I did this once using a
refurbished Cahn-G2 electrobalance with ~50 ng resolution, and the results were
in agreement with average film thicknesses from an AFM profilometer. See Meas.
Sci. Technol. 18 (2007) N53-N59.

Thomas E. Wilson
Professor of Physics
Marshall University
Science 154
One John Marshall Drive
Huntington, WV  25755-2570
Tel: 304.696.2752
FAX: 304.696.2494
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