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Smoothing Out Nano Edges

A new method melts away tiny defects in nanostructures

By Stephen Ornes

As microchips get progressively smaller and denser, each decrease in size brings its own set of problems. Currently, the fine metallic lines can be as narrow as a few dozen nanometers, so edgewise irregularities or edge roughness of just a few nanometers can cause major problems, such as current leakage or voltage fluctuation in a microprocessor. These tiny blemishes on the nano lines arise from the random fluctuation of electrons or photons during the process of nanofabrication.

Posted: 2008-05-13

For more information: http://www.technologyreview.com/Nanotech/20761/