Dr. K. S. Krishnan Marg, PUSA Road, New Rajinder place New Delhi, Delhi 110012 IN 8527375059 vijay_toutam@yahoo.co.in
Goal
Local spectroscopic characterization of nanosystems especially nanomaterials for Photonics and electronics applications.
Skills
Scanning probe lithography, e-beam lithography, micromachining, Soft lithography, wet synthesis and all AFM related techniques.
Qualifications
ACADEMIC BACKGROUND
Scientist Dec 2011- present Nanoscale Measurements, Quantum Phenomena and Applications, National Physical Laboratory, Dr. K. S. Krishnan Marg, New Delhi 10012
Scientist fellow Nov 2010 - Dec 2011 Centre for Nanoscale Science, National Physical Laboratory, Dr. K. S. Krishnan Marg, New DelhiÃÂ 110012
Post doctoral Fellow Jan 2009 - Sep 2010 Electrical Engineering department, Pennsylvania State University. University Park, State College, Pennsylvania, USA Project Title: Enhanced visibility of Graphene on patterned gold substrate and Kelvin probe force microscopy study of Graphene.
Doctor of Philosophy in Nanoscience and Nanotechnology November 2008 Jawaharlal Nehru Centre for Advanced Scientific Research, Chemistry and Physics of Material Unit, Bangalore, India. Specialisation: Material science, Nanochemistry, Polymer nano-lithography, Microscopy and Spectroscopy. Dissertation title: Conducting AFM based Lithography for Patterning and Electrical Characterization of Nanomaterials.
Master of Science in Physical Sciences May 2003 University of Hyderabad School of Physics Hyderabad, India Specialisation: Material Science Project Title: Ferromagnetic resonant studies on Mn1.22Sb thin films deposited by physical vapor deposition.
EXPERTISE
Scanning probe and electron beam based spectroscopic, microscopic characterization and electric breakdown studies of nanomaterials and thin films. Lithography and micro-machining techniques.
INTERESTS
Local spectroscopic characterization of nanosystems especially nanomaterials for Photonics and electronics applications.
SKILLS
Atomic force microscopy- MFM - Magnetic force microscopy, EFM - Electric force microscopy, KPFM - Kelvin probe force microscopy, CAFM - Conducting Atomic Force microscopy, SCM - Scanning Capacitance microscopy, LAO - Local anodic oxidation, Nanomanipulation and Indentation
Scanning Electron Microscopy- Energy dispersive spectroscopy and elemental mapping, EBID (Electron Beam Induced deposition) and EBL (Electron beam Lithography)
Fabrication techniques- Micromachining of Silicon, Soft lithography, Scanning probe lithography and e-beam lithography, Photolithography and Deep Reactive ion etching.
Spectroscopic techniquesÃÂ UV-vis, Photoluminescence, Raman and X-ray & Photo electron spectroscopy.
Wet synthesis- Metal and chalcogenide nanoparticle synthesis (Phase transfer methods), Self assembled monolayer preparation and solution based micro machining techniques.
Computational skills - Fortran, C, C++, Matlab and Origin
PUBLICATIONS IN JOURNALS
N. Muhunthan, Om Pal Singh, Vijaykumar Toutam, V.N. Singh, Electrical characterization of grain boundaries of CZTS thin films using conductive atomic force microscopy techniquesÃÂâÃÂÃÂÃÂÃÂ, Materials Research Bulletin, 70, 373 (2015) Vijaykumar Toutam, Puneet Jain, Rina Sharma, Sivaiah Bathula, Ajay Dhar, ÃÂâÃÂÃÂÃÂÃÂRadius ratio rule for surface hydrophilization Radius ratio rule for surface hydrophilization of polydimethyl siloxane and silica nanoparticle compositeÃÂâÃÂÃÂÃÂÃÂ, Appl. Surf. Sci. 349, 196 (2015). Kriti Tyagi, Bhasker Gahtori, Sivaiah Bathula, Vijaykumar Toutam, Sakshi Sharma, Niraj Kumar Singh and Ajay Dhar, ÃÂâÃÂÃÂÃÂÃÂThermoelectric and mechanical properties of spark plasma sintered Cu3SbSe3 and Cu3SbSe4: Promising thermoelectric materialsÃÂâÃÂÃÂÃÂÃÂ, Appl. Phys. Lett. 105, 261902 (2014). Pramod Kumar, Anjana Dogra, Vijaykumar Toutam,ÃÂâÃÂÃÂÃÂàPin hole mediated electrical transport across LaTiO3/SrTiO3 and LaAlO3/SrTiO3 oxide hetero-structuresÃÂâÃÂÃÂÃÂàAppl. Phys. Lett, 103, 211601 (2013). Vijaykumar Toutam, H. Pandey, R. C. Budhani, ÃÂâÃÂÃÂÃÂÃÂFormation of double ring patterns on Co2MnSi Heusler alloy thin film by anodic oxidation under scanning probe microscopeÃÂâÃÂÃÂÃÂÃÂ, AIP Advances, 3, 022124 (2013). B.R. Chakraborty, S.K. Halder, K.K. Maurya, A.K. Srivastava, V.K. Toutam, M.K. Dalai, G. Sehgal, S. Singh, ÃÂâÃÂÃÂÃÂÃÂEvaluation of depth distribution and characterization of nanoscale Ta/Si multilayer thin film structuresÃÂâÃÂÃÂÃÂÃÂ, Thin Solid Films, 520, 20, 6409 (2012). T. Vijayakumar, K. Narendra and G.U. Kulkarni, ÃÂâÃÂÃÂÃÂÃÂElectron Beam Induced Carbonaceous Deposition as a Local Dielectric for CNT CircuitsÃÂâÃÂÃÂÃÂÃÂ, Inter. J. Nanosci., 10, 935 (2011). T. Vijaykumar, Narendra Kurra and G. U. Kulkarni ÃÂâÃÂÃÂÃÂÃÂCNT Manipulation: Inserting a Carbonaceous Dielectric Layer Beneath Using Electron Beam Induced DepositionÃÂâÃÂÃÂÃÂÃÂ, J. Nanosci. Nanotech, 11, 1025, (2011). P. Joshi1, H. E. Romero, A T Neal, V. K. Toutam, and S. A. Tadigadapa ÃÂâÃÂÃÂÃÂÃÂIntrinsic Doping and Gate Hysteresis in Graphene Field Effect Devices fabricated on SiO2 substratesÃÂâÃÂÃÂÃÂÃÂ, J. Phys.: Condens. Matter 22, 33421 (2010). T. Vijaykumar, Gargi Raina, Stefan Heun and G. U. Kulkarni ÃÂâÃÂÃÂÃÂÃÂCatalytic behavior of individual Au nanocrystals in the local anodic oxidation of Si surfacesÃÂâÃÂÃÂÃÂÃÂ, J. Phys. Chem. C,112, 13311 (2008). T. Vijaykumar and G. U. Kulkarni ÃÂâÃÂÃÂÃÂÃÂLocal anodic oxidation patterning of Au deposited Si surfacesÃÂâÃÂÃÂÃÂÃÂ, J. Nanosci. Nanotech, 9, 5351( 2008). TomaÃÂÃÂÃÂÃÂz Mlakar, Giorgio Biasiol, Stefan HeunÃÂâÃÂÃÂÃÂÃÂ, Lucia Sorba, T. VijayKumar, G U. Kulkarni, Vittorio Spreafico and Stefano Prato ÃÂâÃÂÃÂÃÂÃÂConductive Atomic Force Microscopy of InAs/GaAs Quantum RingsÃÂâÃÂÃÂÃÂÃÂ, Appl. Phys. Lett, , 92, 192105 (2008). R. K. Rakshit, T. Vijaykumar, S. K. Bose, R. Sharma, R. C. Budhani, S. J. Neena, and G. U. Kulkarni ÃÂâÃÂÃÂÃÂÃÂCorrelations between morphology, crystal structure, and magnetization of epitaxial cobalt-platinum films grown with pulsed laser ablationÃÂâÃÂÃÂÃÂÃÂ, J. Appl. Phys., 103, 023915 (2008). T. Vijaykumar and G.U. Kulkarni ÃÂâÃÂÃÂÃÂÃÂElectrostatic nanolithography on PVP films for patterning metal nanocrystals and fullerenesÃÂâÃÂÃÂÃÂÃÂ, Nanotechnology, 18, 445303(2007). T. Vijaykumar, R Sanketh and G.U. Kulkarni, ÃÂâÃÂÃÂÃÂÃÂPolar-solvent mediated phase-transfer of nanocrystals of metals and semiconductors from an aqueous to an organic phaseÃÂâÃÂÃÂÃÂÃÂ, Chem. Phys. Lett., 436167(2007). T. Vijaykumar and G.U. Kulkarni ÃÂâÃÂÃÂÃÂÃÂA study of LAO nanopatterns on Si substrates of different crystallographic orientationsÃÂâÃÂÃÂÃÂÃÂ, Solid State Commun, 142, 89(2007). T. Vijaykumar, Neena Susan John, G.U. Kulkarni, ÃÂâÃÂÃÂÃÂÃÂA resistless photolithography method for robust markers and electrodesÃÂâÃÂÃÂÃÂÃÂ, Solid State Sci. 7,1475(2005).
CONFERENCE PRESENTATIONS
T. Vijaykumar, G. U. Kulkarni, Tomaz Mlakar, Georgio Biasiol, Lucia Sorba & Stefan Heun ÃÂâÃÂÃÂÃÂÃÂConducting Atomic Force Microscopy and Electric Force Microscopy of InAs / GaAs Quantum ringsÃÂâÃÂÃÂÃÂàICONSAT - 2008, Chennai Trade Centre, Chennai, India. T. Vijaykumar, G. U. Kulkarni ÃÂâÃÂÃÂÃÂàAFM based polymer nanolithographyÃÂâÃÂÃÂÃÂÃÂ, Bangalore Nano- 2008, Bangalore, India. T. Vijaykumar, G. U. Kulkarni, ÃÂâÃÂÃÂÃÂÃÂAFM based Nanolithography on Silicon and Polymer surfacesÃÂâÃÂÃÂÃÂàNational Review Coordination Meeting (NSNT-2007), Hyderabad, India. T. Vijaykumar, G. U. Kulkarni, ÃÂâÃÂÃÂÃÂÃÂElectrostatic nanolithography on PVP films for patterning metal nanocrystals and fullerenesÃÂâÃÂÃÂÃÂÃÂ, The 10th international Conference on Advanced Materials, (IUMRS-ICAM, 2007), Bangalore, India T. Vijaykumar, G. U. Kulkarni ÃÂâÃÂÃÂÃÂÃÂA Pt nanowire circuit by electron beam induced deposition ÃÂâÃÂÃÂÃÂÃÂ, JNC Materials Conference - 2007, Kollam, Kerala, India. T. Vijaykumar, G. U. Kulkarni ÃÂâÃÂÃÂÃÂÃÂA Study of LAO Nanopattrens on Si Substrates of different crystallographic orientationsÃÂâÃÂÃÂÃÂàEigth International Conference on Nanostructured Materials (Nano 2006), IISC, Bangalore, India. T. Vijaykumar, G. U. Kulkarni, ÃÂâÃÂÃÂÃÂÃÂA One step Synthesis of Impurity free Metal NanoparticlesÃÂâÃÂÃÂÃÂÃÂ, ICONSAT ÃÂâÃÂÃÂÃÂà2006, ITC, Delhi, India. T. Vijaykumar, ICMR-JNCASR International Winter School on Chemistry of Materials - 2006, JNCASR, Bangalore, India. PROJECT
PROGRAMME OF SCIENTIFIC AND TECHNOLOGICAL CO-OPERATION BETWEEN THE ITALIAN REPUBLIC AND THE REPUBLIC OF INDIA 2005-2007
Project MST 1: Spectroscopic Investigations of Dip-pen Nanolithography Patterns ÃÂâÃÂÃÂÃÂÃÂC-AFM investigations of nanostructures grown by MBEÃÂâÃÂÃÂÃÂÃÂ
Italian scientific coordinator: Dr. Stefan Heun CNR - Istituto Nazionale per la Fisica della Materia, Laboratorio Nazionale TASC, Area Science Park ÃÂâÃÂÃÂÃÂàBasovizza, Edificio MM - S.S. 14 Km. 163,5, 34012 Basovizza (TS), Trieste, Italy from 26 March 2007 to 24 April 2007
ACHIEVEMENTS AND AWARDS Graduation passed with distinction Appointed as an Interviewer by CBSE, India to conduct Physics practical for the year 2004. Acquired 95% in Graduate Aptitude test exam. Best Poster award in International conference on Materials, IUMRS-ICAM (2007), Bangalore, India for the work on ÃÂâÃÂÃÂÃÂÃÂelectrostatic nanolithographyÃÂâÃÂÃÂÃÂÃÂ. Teaching and demonstration classes on AFM imaging and principle in ÃÂâÃÂÃÂÃÂÃÂDST school on Nanoscience- 2007ÃÂâÃÂÃÂÃÂàfor lecturers and students from all over India. PG LEVEL THESIS SUPERVISION Supervised three master degree students and mentoring a Ph.D student. Teaching experience Worked as a lecturer for under graduate Physics course and as head of the Physics division in IVY League academy, Hyderabad, Andhra Pradesh.