KEVIN DAVIDSON 3348 Warner Rd * Richmond, VA 23225 * (804) 920-3857 * kdavidson0@gmail.com OBJECTIVE To secure a position in the semiconductor/electronics industry that will allow me to contribute the skills and experience I have acquired while offering the opportunity for continued growth and development PROFESSIONAL EXPERIENCE 2005-09 Qimonda Sandston, VA Failure Analysis Technician 1. Performed wafer level and die level physical failure analysis on silicon DRAM and graphics DDR memory semiconductor products 2. Identified defects and anomalies on fully layered silicon die and provided analysis results to fabrication process engineers 3. Interpreted electrical bitmap signatures and patterns to help identify physical fail causes 4. Worked closely with failure analysis engineers to characterize fail modes and defect mechanisms 5. Prepared samples for transmission electron microscopy (TEM) analysis 6. Developed a highly successful gate oxide deprocessing technique used in exposing pinhole anomalies that were previously undetectable 2003-05 RF Micro Devices Greensboro, NC Engineering Technician 1. Performed die level and package level failure analysis on gallium arsenide (GaAs) and silicon radio frequency integrated circuit (RFIC) semiconductor devices 2. Identified fail sites using electrical analysis techniques such as DC parametric microprobing and photon emission microscopy (PEM) along with schematic evaluation 3. Authored reports that provided detailed failure analysis results as a service to customers 4. Interfaced with design engineers and quality control personnel to initiate design modifications based on failure analysis findings 5. Consistently located unique die level defects that eventually led to more efficient designs on several RFIC amplifier products 2002-03 RF Micro Devices Greensboro NC Reliability Technician 1. Performed electrostatic discharge (ESD) testing on RFIC semiconductor devices as a function of quality control 2. Developed test plans and device pass/fail criteria 3. Created reports that characterized device performance prior to and following ESD testing 4. Designed printed circuit boards (PCB's) to facilitate ESD testing using Protel design software 5. Instrumental in the installation of a fully automated ESD test station that vastly increased lab throughput and testing accuracy 1999-02 United States Air Force Langley AFB, VA Flight Chief, Ground Radio 1. Supervised six radio communications technicians 2. Inspected, aligned, modified, troubleshot and repaired high frequency (HF), very high frequency (VHF), and ultra high frequency (UHF) radio systems, global positioning systems, antenna systems, and associated electronic support equipment 3. Maintained ground-to-air and point-to-point tactical communications equipment to support contingency deployments of a Ground Theater Air Control System (GTACS) control and reporting element 4. Served as training monitor and quality assurance representative for the Ground Radio Communications Flight 5. Named squadron NCO (non-commissioned officer) and Airman of the Quarter for exceptional performance 6. Won highly esteemed John L. Levitow Award as most outstanding student among class of 42 during Airman Leadership School 1997-99 United States Air Force Incirlik AFB, Turkey Ground Radio Apprentice 1. Installed, repaired, inspected and maintained air traffic control and deployable ground to air systems worth in excess of $1 million 2. Maintained base cable television distribution network 3. Set up public address equipment for visits from high ranking government dignitaries and official functions 4. Named 1998 Airman of the Year for Incirlik AFB EDUCATION AAS, Electronics Systems Technology Community College of the Air Force Langley AFB, VA Ground Radio Maintenance Certification USAF Military Technical School Keesler AFB, MS Advanced Diploma Rustburg High School Rustburg, VA SKILLS Extremely knowledgeable in electronics troubleshooting and repair and semiconductor failure analysis techniques; fluent in the use of a variety of electronic test equipment and computer software, including: - Focused Ion Beam Systems (FIB) - Scanning Electron Microscopy (SEM) - Transmission Electron Microscopy (TEM) Sample Preparation - Energy Dispersive X-Ray Spectroscopy (EDX) - Scanning Acoustic Microscopy (SAM) - Photon Emission Microscopy (PEM) - Microprobing/Mechanical Probe Stations - Optical Microscopy - Reactive Ion/Plasma Etchers (RIE) - Wet Chemistry Semiconductor Deprocessing - Mechanical Cross-section Systems - Parallel/Finger Polishing - X-Ray Systems - Semiconductor ESD Testers - Liquid Crystal Analysis - Thermal Emission Analysis - BView Bitmapping Software - Cadence Software - Knights/Merlin Defect Navigation Software - MS 2000/NT/XP/VISTA - Word/Excel/PowerPoint - Circuit Card Repair/Troubleshooting - Component Level Troubleshooting - Microcircuit Troubleshooting - Schematic Analysis - DC Parametric Curve Tracers - Oscilloscopes - Decibel Meters - Digital/Analog Multimeters - Diode/Transistor Testers - Distortion Analyzers - Frequency Counters - Spectrum Analyzers - Modulation Meters - Power Meters/Wattmeters - RF/Audio Signal Generators - RF/Communication Analyzers REFERENCES AVAILABLE UPON REQUEST