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the MEMS and Nanotechnology Exchange, your microsystem design and fabrication partner.
| Term | Definition |
|---|---|
| Doping | Process of introducing impurity atoms into a semiconductor to affect its conductivity. |
| DRAM | Dynamic Random Access Memory -- memory in which each stored bit must be refreshed periodically. |
| Drift | Gradual departure of the instrument output from the calibrated value. An undesired slow change of the output signal. |
| DSP | Digital Signal Processing; a process by which a sampled and digitized data stream (real-time data such as sound or images) is modified in order to extract relevant information. Also, a digital signal processor. |
| Ductility | A measure of a material's ability to undergo plastic deformation before fracture; expressed as percent elongation (%EL) or percent area reduction (%AR) from a tensile test. |
| Dynamic characteristics | A description of an instrument's behavior between the time a measured quantity changes value and the time the instrument obtains a steady response. |
| Dynamic error | The error that occurs when the output does not precisely follow the transient response of the measured quantity. |
| Dynamic range | The ratio of the largest to the smallest values of a range, often expressed in decibels. |
| EDP | Ethylene diamine pyrocatechol. |
| Elastic deformation | A nonpermanent deformation that totally recovers upon release of an applied stress. |
